Defense of M. MD Jaber AL RASHID thesis10:00 am| Amphi E | POLYTECH ANGERS | 62, avenue Notre-Dame du Lac 49000 ANGERS

The November 13, 2023

Subject : Degradation and Lifetime Reliability Models to Assess the EMC performance of integrated circuits under environmental constraints.

Director of thesis: Ms Mihaela BARREAU

Abstract

Severe environmental conditions can have a significant effect on the electromagnetic compatibility (EMC) performance of analog and digital integrated circuits. In addition, an integrated circuit must operate reliably in an electromagnetic environment. In this thesis, accelerated degradation test plans under constant and staggered stresses were implemented for selected analog and digital ICs, followed by characterization of the evolution of conducted immunity performance in the frequency domain under different stress durations. To estimate EMC performance degradation under tested and untested accelerated aging conditions, a physics-based degradation model is combined with an accelerated lifetime model to predict reliability metrics. The black-box approach was used to build the conducted immunity model, which required characterization of the effect of aging at IC level. The influence of accelerated aging on EMC performance degradation was included in the active and/or passive blocks of the immunity model.